Two steps, often described as one. Photolithography defines an image in photoresist; etching transfers that image into copper and then keeps going, sideways, whether or not anyone wanted it to. The distinction matters because the defects look identical on the finished board — a line that is 15 µm narrow could come from under-exposure, over-development or over-etch — and because neither step can rescue a stack-up whose dielectric height or Dk was wrong to begin with.
The Boundary Between the Two Steps
Photolithography is an imaging process: coat or laminate a photosensitive resist, expose it through a film or with a laser, develop it. What remains is a stencil of cured polymer on copper. Etching is a removal process: put the panel in contact with a solution that dissolves copper, and let the resist decide where that happens.
The boundary is worth stating precisely because it determines who owns which defect:
| Question | Photolithography owns it | Etching owns it |
|---|---|---|
| Where is the line? | Yes — exposure and development set position and width in the resist | No, but it moves the edge inward |
| How wide is the line? | Partly: resist width is the starting dimension | Partly: side etch removes copper under the resist |
| How square is the sidewall? | Resist profile contributes | Dominant: wet etching is isotropic |
| Is the width the same across the panel? | Yes, if exposure is uniform | Dominant: etchant depletion and spray variation |
| Is the impedance right? | No | No — dielectric height and Dk decide that |
The last row is the one that costs money. Etching moves line width by a few microns; the same few microns are worth about 0.6% of impedance per 1% of width. Dielectric height is worth roughly 0.6% per 1% of thickness. Both are real, but they are not the same size of lever, and no amount of etch control compensates for a pressed dielectric that came out 0.08 mm thick instead of 0.06 mm.
What Photolithography Actually Controls
Five variables, and each has a visible consequence on the finished trace:
| Variable | Typical setting | If it drifts |
|---|---|---|
| Resist type and thickness | Dry film 25–50 µm; liquid photoimageable 5–25 µm | Thicker resist resolves coarser lines and holds a more vertical sidewall during etch; thinner resist resolves finer lines but is more easily breached |
| Adhesion to copper | Surface clean, micro-etched, no oxide | Poor adhesion lets etchant creep under the resist edge — a line that measures wide in the resist and narrow in copper, with ragged edges |
| Exposure dose | Roughly 30–70 mJ/cm² for dry film, depending on product | Under-dose leaves soft resist that develops partly or lifts; over-dose widens the image and rounds the profile, narrowing spaces rather than lines |
| Imaging method | Mylar artwork, or LDI (laser direct imaging) | Film scales with temperature and humidity — about 40 ppm, which is 0.024 mm across 600 mm. Below 0.075 mm features, LDI is the practical answer |
| Development | Sodium carbonate around 1%, 30 °C, spray | Over-development erodes resist edges and thins the stencil; under-development leaves scum that blocks the etch entirely, producing a short |
Two corrections to how this step is usually described. First, the resist does not protect “the unexposed area” in general — it protects whatever remains after development, which for a negative resist is the exposed area and for a positive resist is the unexposed area. Articles that name one direction as universal are describing half the chemistry. Second, faster exposure is a throughput variable, not a yield variable: dose sets line width and sidewall angle, and pushing it to raise throughput moves both.
What Etching Controls
Wet etching of copper is a chemical dissolution run at a controlled rate. Five parameters define the rate, and all five move during a production day:
| Parameter | Typical window | Effect |
|---|---|---|
| Chemistry | Cupric chloride (CuCl2) or alkaline ammonia | Different rate, different regeneration, different copper loading tolerance. Ferric chloride is still used in some shops but is messy to regenerate |
| Copper concentration | Maintained within a set band (roughly 100–160 g/L dissolved copper for cupric chloride) | As copper builds up, rate falls and sludge forms; both widen the distribution across the panel |
| Temperature | 45–55 °C, held to ±1–2 °C | Etch rate rises several percent per degree. A two-degree drift is a measurable line-width shift |
| Spray pressure and pattern | Roughly 1.5–2.5 bar, oscillating nozzles above and below | Low pressure starves the surface of fresh etchant and lets spent solution sit on the copper; blocked nozzles produce streaks |
| Conveyor speed | Set so the panel exits just as the last copper clears | The most common operator adjustment, and the one that silently changes line width. Slower means more side etch as well as more depth |
Note what is not on that list: the target line width. Etching removes copper isotropically, so it cannot be told to remove 12 µm vertically and 3 µm laterally. That ratio is a property of the process — the etch factor, typically around 2.5 for spray etching — and the only way to control the lateral loss is to control the copper thickness and the time. The arithmetic (side etch equals copper thickness divided by etch factor) is worked through in the inner-layer fabrication article, because that is where it is usually applied.
Uniformity Across the Panel Is the Real Specification
An etch line can hold a nominal line width and still fail, because what matters is the distribution. Three effects stack up:
- Position on the panel. Etchant arrives at the leading edge fresh and at the trailing edge partly spent; nozzles cover the centre differently from the edges. A ±5–10% spread in etch depth across a 600 mm panel is normal, and it translates directly into a line-width spread.
- Copper loading. A panel with 70% copper coverage consumes the bath far faster locally than one with 30%. Mixed panels in the same load etch unevenly, which is why heavy-copper and light-copper work is usually batched separately.
- Feature density. Isolated lines etch faster than lines inside a dense array, because the local etchant is renewed more freely. This is the mechanism behind “same drawn width, different measured width” on one board.
The practical consequence for RF work: a coupon placed at the panel edge does not represent a filter in the centre. Coupons should be placed where the critical features are, and, if the design has both, one at each. The impedance consequences of a width error are quantified in the impedance control article.
Defects, Attributed Correctly
| Defect | Appearance | Actual cause |
|---|---|---|
| Lines uniformly narrow | All traces on the panel under target | Over-etch (time, temperature, or rate drift) — or artwork drawn narrow. Distinguish by measuring the resist before etch |
| Lines narrow at panel edges only | Centre in specification | Etch uniformity, not dose: the edges are over-exposed to fresh etchant |
| Ragged or scalloped edges | Irregular copper edge under the resist | Resist adhesion failure — undercut by etchant creeping beneath the film. Often a cleaning or lamination problem, not an etch problem |
| Resist residues after etch | Polymer islands on copper | Under-development or resist reflow; usually shows up later as a solder mask adhesion defect |
| Shorts in fine-pitch areas | Copper bridges between traces | Under-etch from spent etchant, or resist that never cleared; check the development stage before blaming the bath |
| Pink ring around holes | Halo of pink oxide at the inner-layer pad | Not etching — it is an oxide/lamination interface effect, and it appears months after build |
| Trapezoidal sidewall | 45–60° wall instead of vertical | Intrinsic to isotropic wet etching. Only thick resist and thin copper reduce it |
What Etching Cannot Fix
- Dielectric height. Set by core thickness plus pressed prepreg. Etching cannot reach it.
- Dk and Df. Material properties. A line that measures perfectly and sits on the wrong laminate is still the wrong impedance.
- Layer registration. Set by the exposure tool and by lamination movement; etch only makes a misregistered pad smaller.
- Copper roughness. Foil property. At 10 GHz roughness dominates conductor loss on smooth-foil budgets, and no etch recipe changes it.
- Surface finish. A separate step entirely. Nickel thickness on an ENIG board matters more above 10 GHz than a 5 µm line-width error.
This is why a line-width measurement alone is a weak acceptance criterion. It confirms the etch step did what it was told; it does not confirm the board is the board that was designed. The measurement that does that is a coupon TDR or S-parameter result, in the same place on the panel as the critical features.
Why Plasma Is Not Used for Patterning Here
Dry etching — plasma or reactive ion — is anisotropic: it removes material vertically far faster than laterally, which is why semiconductor fabs use it. On a PCB it is not a patterning method, for two reasons. Copper has no volatile plasma product at practical temperatures, so the removal rate is unusably slow; and panels are large, thick and covered in resist that would not survive the process.
Plasma does have two real jobs in PCB fabrication, and both are often confused with etching: desmearing drilled holes, and activating PTFE surfaces before plating. Those are surface preparation, not pattern transfer. The full sequence of steps and where each sits is mapped in the manufacturing process guide.
What to Specify
- Drawn width versus finished width. Say which the Gerber represents, and state the compensation if any. A fabricator who assumes the other convention produces a board that is uniformly wrong.
- Copper thickness for the layer, because it sets the side etch: 0.5 oz, 1 oz and 2 oz lose roughly 7, 14 and 28 µm per side at an etch factor of 2.5.
- Imaging capability if the design has features below 0.075 mm: LDI, or film with a documented expansion allowance.
- Where coupons go, and whether one per panel or one per critical feature group.
- Line-width tolerance as a finished dimension, with the measurement method named — cross-section and AOI give different numbers.
Claims That Do Not Hold
| Claim | Reality |
|---|---|
| “The photoresist protects the unexposed area during etching” | It protects whatever survives development. For negative resist that is the exposed area; for positive resist, the unexposed area. Naming one direction as universal describes half the chemistry |
| “Faster exposure raises yield” | Dose sets line width and sidewall profile. Faster exposure raises throughput and moves both — a trade, not a gain |
| “Dry etching gives finer lines and lower loss on PCBs” | There is no dry patterning step for copper on a PCB panel. Plasma is used for desmear and PTFE activation only; laser is used for direct imaging and drilling, not for removing copper |
| “Ferric chloride or copper sulphate is the standard etchant” | Copper sulphate is a plating electrolyte. Production etchants are cupric chloride or alkaline ammonia |
| “Etch control is how you hit impedance” | Etch contributes a few percent. Dielectric height and Dk dominate; etch control protects the design, it does not create it |
Conclusion
Photolithography decides where copper will remain; etching decides how much of it survives, in both directions. Treating them as one step makes every width defect ambiguous, and ambiguity is expensive: it sends investigation to the etch bath when the problem was resist adhesion, or to the artwork when the problem was panel position. Separate the two, measure the resist before etch, and place coupons where the critical features are. Then accept the one thing wet etching will not do — a vertical wall — and design the copper thickness around it.
XCE PCB runs LDI imaging, cupric-chloride etching with per-panel coupon control, and PTFE-qualified plasma activation: 2–72 layers, impedance held to ±10%, panels to 600 × 1200 mm, 5,000 m² of production space and 80+ engineers, with samples in as fast as 24 hours.
Frequently Asked Questions
What is the difference between photolithography and etching in PCB manufacturing?
Which etchants are used for PCB copper?
Why is the copper edge trapezoidal instead of vertical?
Why is line width different in the middle of the panel than at the edge?
Can etching be used to tune impedance?
Is plasma etching used to pattern copper on PCBs?
Line Width Drifting in Production?
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